Concurrent 4D-STEM–EDX analysis
Correlative diffraction, spectroscopy, and profile analysis for beam-sensitive and structurally complex materials.
This research develops correlative analysis workflows that combine concurrent 4D-STEM and EDX acquisition with profile-based structural analysis. The work is aimed at extracting nanoscale structural and compositional information from materials that are beam-sensitive or otherwise difficult to characterise by a single measurement.
The associated open workflow is available through SENDePSIC.
Publications
- J. Ryu, et al., Resolving nanoscale heterogeneities in lead halide perovskites through low-dose concurrent 4D-STEM–EDX mapping, Advanced Materials (2026).
- N. Topping, J. Ryu, et al., Sulfur-bearing serpentine in carbonaceous chondrites, Meteoritics & Planetary Science (2025).