CV

An interactive, automated 4D-STEM data acquisition and analysis routine for scanning electron nanobeam diffraction and ptychography experiments

M. Danaie^†, M. England, Y. Xu, R. Zhang, E. Darnbrough, J. W. de Boer, F. Allars, Z. Najeeb, A. Varambhia, J. Ryu, B. Bradnick, D. McGrouther, M. E. Schuster, C. S. Allen

arXiv preprint

DOI: 10.48550/arXiv.2608.13752

Resolving nanoscale heterogeneities in lead halide perovskites through low dose concurrent 4D-STEM-EDX mapping

J. Ryu^†, A. A. Sheader, M. Danaie, D. G. Hopkinson, K. E. MacArthur, N. K. Noel^*, C. S. Allen^*

Advanced Materials

DOI: 10.1002/adma.74382

Dynamics of dislocation formations and their impacts on exsolution in Ru-doped perovskite oxide

S. Choi^†, Y. Lim^†, P. Guha, H. Kim, J. Kim, S. Kim, R. Harder, W. Cha, H. Suh, J. Ryu, S. Yang, H. I. Ji^*, D. H. Kwon^*, H. Kim^*

Nature Communications

DOI: 10.1038/s41467-026-73457-7

4D-STEM nanoscale phase mapping of the solid-electrolyte interphase

Y. Xu^†, J. Ryu, B. Jagger, J. Zhao, M. Pasta^*, C. S. Allen^*

ChemRxiv preprint

DOI: 10.26434/chemrxiv.15000589/v1

In situ transmission electron microscopy visualization of electric-field-induced phase transitions at the morphotropic phase boundary in Hf0.5Zr0.5O2

S. Lee^†, S. Kim^†, J. Ryu^†, J. Lee, J. Hong, J. E. Kim, J.-Y. Cha, Y. Shin, D. Kwon, J. H. Yoon, M. H. Park, M. Kim^*, S.-Y. Lee^*

ACS Nano

DOI: 10.1021/acsnano.5c15856

A hierarchical shell locks and stabilizes perovskite nanocrystals with near-unity quantum yield

Q. Zeng^†, Y. Zhao, S. Park, H. Zhou, H.-J. Shim, T. Li, J. Ryu, M.-J. Sung, X. W. Chua, E. Yoon, B. A. I. Lewis, S.-J. Woo, M. Forzatti, M. J. Kim, E. A. Kim, L. Dai, J. Jang, Y. Tang, J. J. Kweon, T.-W. Lee^*

Science

DOI: 10.1126/science.ady1370

Spatio-compositional characterization of the solid electrolyte interphase in solid-state batteries via nanobeam electron diffraction microscopy

J. Ihli^*, Y. Chart^†, J. Ryu, Y. Liang, P. Y. Huang, H. Guo, D. G. Hopkinson, G. Hughes, Y. Xu, M. Pasta, C. S. Allen^*

Research Square preprint

DOI: 10.21203/rs.3.rs-7898763/v1

Sulfur-bearing serpentine in carbonaceous chondrites

N. Topping^†*, J. C. Bridges, L. J. Hicks, L. Petera, C. S. Allen, J. Ryu, D. G. Hopkinson, M. Danaie, L. Blase, F. M. Willcocks, G. Douglas, H. G. Changela, T. Noguchi, T. Matsumoto, A. Miyake

Meteoritics and Planetary Science

DOI: 10.1111/maps.70069

Variable-range hopping conduction in amorphous, non-stoichiometric gallium oxide

P. Hein^†, T. Romstadt, F. Draber, J. Ryu, T. Boeger, A. Falkenstein, M. Kim, M. Martin^*

Advanced Electronic Materials

DOI: 10.1002/aelm.202400407

Molecular beam epitaxial In2Te3 electronic devices

I. Kim^†, J. Ryu, E. Lee, S. Lee, S. Lee, W. Suh, J. Lee, M. Kim, H. S. Oh, G.-C. Yi^*

NPG Asia Materials

DOI: 10.1038/s41427-024-00578-0

Direct three-dimensional observation of the plasmonic near-fields of a nanoparticle with circular dichroism

J. Jo^†, J. Ryu^†, J. H. Huh, H. Kim, D. H. Seo, J. Lee, M. Kwon, S. Lee^*, K. T. Nam^*, M. Kim^*

ACS Nano

DOI: 10.1021/acsnano.4c10677

Iridium-cooperated, symmetry-broken manganese oxide nanocatalyst for water oxidation

S. Park^†, T. Jang^†, S. Choi^†, Y. H. Lee, K. H. Cho, M. Y. Lee, H. Seo, H. K. Lim, Y. Kim, J. Ryu, S. W. Im, M. G. Kim, J. S. Park, M. Kim, K. Jin, S. H. Kim, G. S. Park, H. Kim, K. T. Nam^*

Journal of the American Chemical Society

DOI: 10.1021/jacs.3c07411

Boron-doped amorphous carbon deposited by DC sputtering for a hardmask: microstructure and dry etching properties

S. Kim^†, U.-g. Kim, J. Ryu, D. Kim, M. Kim, Y.-C. Joo, S.-Y. Lee^*

Applied Surface Science

DOI: 10.1016/j.apsusc.2023.157895

Overcharge-induced phase heterogeneity and resultant twin-like layer deformation in lithium cobalt oxide cathode for lithium-ion batteries

J. Oh^†, S. Y. Lee, H. Kim, J. Ryu, B. Gil, J. Lee, M. Kim^*

Advanced Science

DOI: 10.1002/advs.202203639

Atomic reconstruction and oxygen evolution reaction of Mn3O4 nanoparticles

S. Yoon^†, H. Seo, K. Jin, H. G. Kim, S. Y. Lee, J. Jo, K. H. Cho, J. Ryu, A. Yoon, Y. W. Kim, J. M. Zuo, Y. K. Kwon, K. T. Nam, M. Kim^*

The Journal of Physical Chemistry Letters

DOI: 10.1021/acs.jpclett.2c01638

Correlative study between the local atomic and electronic structures of amorphous carbon materials via 4D-STEM and STEM-EELS

J. Ryu^†, S. Lee^†, S. Kim, Y.-C. Joo, M. Kim^*

Applied Physics Letters

DOI: 10.1063/5.0100925

Dimensionality reduction and unsupervised clustering for EELS-SI

J. Ryu^†, H. Kim, R. M. Kim, S. Kim, J. Jo, S. Lee, K. T. Nam, Y.-C. Joo, G.-C. Yi, J. Lee, M. Kim^*

Ultramicroscopy

DOI: 10.1016/j.ultramic.2021.113314

Concurrent acquisition of many 4D-STEM-EDX data pairs and effective data analysis workflow for beam-sensitive materials

J. Ryu^†, A. Sheader, M. Danaie, D. Hopkinson, K. MacArthur, N. Noel, C. Allen^*

Oral presentation · EMAG 2025, Manchester, United Kingdom

Automation of simultaneous 4D-STEM-EDX acquisition and data analysis for beam-sensitive materials

J. Ryu^†, A. Sheader, M. Danaie, D. Hopkinson, K. MacArthur, N. Noel, C. Allen^*

Oral presentation · 13th Asia Pacific Microscopy Congress, Brisbane, Australia

Mapping electrical properties using STEM-EBIC for electric field-induced resistance changes in amorphous gallium oxide

S. Lee^†, J. Ryu, S. Lee, P. Hein, M. Martin, Y. Kim, M. Kim^*

Oral presentation · 13th Asia Pacific Microscopy Congress, Brisbane, Australia

In-situ biasing TEM analysis of resistive switching in amorphous GaOx for next-generation memory applications

S. Lee^†, J. Ryu, H. Philipp, M. Martin, M. Kim^*

Oral presentation · Materials Research Society Fall Meeting, Boston, United States

Ptychography optimization for atomic analysis of bending mode in bilayer transition metal dichalcogenide translational motion

Y. Chang^†, J. Ryu, H. Yoo, H. N. Han, M. Kim^*

Oral presentation · 17th European Microscopy Congress, Copenhagen, Denmark

GPU-based fast reconstruction and DL-based feature extraction for EELS tomography

J. Ryu^†, J. Jo, H. Kim, K. T. Nam, M. Kim^*

Oral presentation · 20th International Microscopy Congress, Busan, South Korea

Exploring ionic migration and structural evolution in dielectric devices

J. Ryu^† (on behalf of Prof. Miyoung Kim), G. Kim, S. Lee, M. Kim^*

Invited talk · 20th International Microscopy Congress, Busan, South Korea

A comprehensive nanoscale characterization of amorphous carbon films through STEM-EELS and 4D-STEM

J. Ryu^†, S. Lee, S. Kim, Y.-C. Joo, M. Kim^*

Oral presentation · 20th International Microscopy Congress, Busan, South Korea

Revealing the resistive switching mechanism in transition metal oxide film using in-situ biasing TEM

S. Lee^†, J. Ryu, S. Y. Kim, G. Park, S. D. Hyun, S. Y. Yang, M. Kim^*

Oral presentation · 20th International Microscopy Congress, Busan, South Korea

Unraveling surface plasmon peak splitting in silver nanoparticles decorated on ZnO nanorods via monochromated STEM EELS tomography

J. Jo^†, J. Ryu, M. Kim^*

Poster presentation · 20th International Microscopy Congress, Busan, South Korea

Unsupervised learning strategies for extracting features from STEM-derived multi-dimensional data

J. Ryu^†, J. Jo, S. Lee, M. Kim

Invited talk · Korea Society of Microscopy Spring Conference, Daejeon, South Korea

A machine-learning approach to characterization of amorphous materials with EELS-SI and 4D-STEM

J. Ryu^†, S. Lee, S. Kim, I. Yoo, Y.-C. Joo, M. Kim^*

Poster presentation · Materials Research Society Spring Meeting, Hawaii, United States

Three-dimensional characterization of nanoparticles with simultaneously acquired bright-field, dark-field, and secondary electron signals in STEM

J. Jo^†, K. MacArthur, J. Ryu, H. Kim, S. Collins, K. Müller-Caspary, K. Nam, M. Kim, R. E. Dunin-Borkowski^*

Poster presentation · PICO 2021, virtual conference

Feature extraction and reconstruction of electron energy loss spectroscopy by non-negative matrix factorization

J. Ryu, J. Jo, J. Lee^†, M. Kim^*

Oral presentation · 12th Asia Pacific Microscopy Congress, Hyderabad, India