Data-driven and AI-assisted Microscopy Analysis
Turning high-dimensional microscopy data into interpretable spectral, structural, and compositional insight.
Modern transmission electron microscopes (TEM) produce increasingly large and high-dimensional datasets, including three-dimensional spectrum imaging and four-dimensional scanning transmission electron microscopy (4D-STEM) measurements. At each probe position, the recorded signal may consist of a spectrum containing thousands of energy channels or a diffraction pattern containing tens of thousands of detector pixels. Extracting interpretable information from these datasets remains challenging because of limited signal-to-noise ratios, particularly under low-dose conditions, as well as the computational demands and subjectivity associated with conventional analysis. I develop data-driven approaches that make those datasets more interpretable while preserving a clear connection to the underlying physics.
Visual highlights
Selected outputs
- J. Ryu, et al., Dimensionality reduction and unsupervised clustering for EELS-SI, Ultramicroscopy (2021).
- J. Jo, J. Ryu, et al., Direct three-dimensional observation of the plasmonic near-fields of a nanoparticle with circular dichroism, ACS Nano (2024).
- J. Ryu, et al., Resolving nanoscale heterogeneities in lead halide perovskites through low dose concurrent 4D-STEM-EDX mapping, Advanced Materials (2026).